Modern optical characterization techniques for semiconductors and semiconductor devices :
26-27 March 1987, Bay Point, Florida /
O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

Description

Related Names

Song, J. J.
Pollak, Fred H.
Glembocki, O. J.
Metallurgical Society (U.S.)
Society of Photo-optical Instrumentation Engineers.

Language(s)

English

Published

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.

Subjects

Semiconductors > Semiconductors / Optical properties > Semiconductors / Optical properties / Congresses.
Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Optical methods > Semiconductors / Testing / Optical methods / Congresses.

Physical Description

vi, 282 p. : ill. ; 28 cm.

ISBN

089252829X

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