Characterization of very high speed semiconductor devices and integrated circuits :
23-25 March 1987, Bay Point, Florida /
Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

Description

Related Names

Jain, Ravi.
Metallurgical Society (U.S.)
Society of Photo-optical Instrumentation Engineers.

Language(s)

English

Published

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.

Subjects

Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses.
Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses.
Very high speed integrated circuits > Very high speed integrated circuits / Congresses.

Physical Description

x, 359 p. : ill. ; 28 cm.

ISBN

0892528303

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