Spectroscopic characterization techniques for semiconductor technology :
9-10 November 1983, Cambridge, Massachusetts /
Fred H. Pollak, Robert S. Bauer, chairmen/editors

Description

Related Names

Bauer, Robert S
Pollak, Fred H
Society of Photo-optical Instrumentation Engineers

Language(s)

English

Published

Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, c1984

Subjects

Spectrum analysis > Spectrum analysis / Congresses
Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses

Physical Description

vi, 203 p. : ill. ; 28 cm

ISBN

0892524871 (pbk.)

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