Modern optical characterization techniques for semiconductors and semiconductor devices :
26-27 March 1987, Bay Point, Florida /
O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
APA Citation
Song, J. J., Pollak, F. H., Glembocki, O. J., Metallurgical Society (U.S.)., Society of Photo-optical Instrumentation Engineers. (1987). Modern optical characterization techniques for semiconductors and semiconductor devices: 26-27 March 1987, Bay Point, Florida. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering.
MLA Citation
Society of Photo-optical Instrumentation Engineers, et al.. Modern Optical Characterization Techniques for Semiconductors And Semiconductor Devices: 26-27 March 1987, Bay Point, Florida. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
Warning: These citations may not always be complete (especially for serials).