Spreading resistance analysis for silicon layers with nonuniform resistivity /
David H. Dickey and James R. Ehrstein.
|Main Author:||Dickey, David H.|
|Related Names:||Ehrstein, James R.|
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1979.
Electric resistance, Spreading.
Semiconductors > Semiconductors / Testing.
"Issued May 1979."
"This activity was supported by the Defense Advanced Research Projects Agency."
vi, 65 p. :
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