A manual wafer probe station for an integrated circuit test system /
G.P. Carver and W.A. Cullins.

Description

Main Author

Carver, G. P.

Related Names

Cullins, W. A.
United States. National Bureau of Standards.
Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.

Language(s)

English

Published

[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : 1981.

Subjects

Probes (Electronic instruments)
Integrated circuits > Integrated circuits / Testing.

Note

Item 247.
S/N 003-003-02319-1.
"Issued May 1981."
"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."

Physical Description

iv, 14 p. : ill. ; 26 cm.

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