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790320s1979 dcu f00010 eng |
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‡a79607012
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‡aRECLAMATION
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‡a247
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‡aC 13.10:400-48
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‡aC 13.10:400/48
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‡aC131040048
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‡aC 13.10:400/48
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‡a(OCoLC)4856570
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‡aDickey, David H.
|
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1 |
0 |
‡aSpreading resistance analysis for silicon layers with nonuniform resistivity /
‡cDavid H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
|
260 |
0 |
⊔ |
‡aWashington :
‡bDept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
‡c1979.
|
265 |
⊔ |
⊔ |
‡a20402.
|
300 |
⊔ |
⊔ |
‡avi, 65 p. :
‡bill. ;
‡c26 cm.
|
490 |
⊔ |
0 |
‡aSemiconductor measurement technology.
|
490 |
0 |
⊔ |
‡aNBS special publication ; 400-48.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aSilicon
‡xElectric properties.
|
650 |
⊔ |
0 |
‡aElectric resistance, Spreading.
|
650 |
⊔ |
0 |
‡aSemiconductors
‡xTesting.
|
700 |
1 |
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‡aEhrstein, James R.
‡ejoint author.
|
710 |
1 |
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‡aUnited States.
‡bDefense Advanced Research Projects Agency.
|
710 |
2 |
0 |
‡aCenter for Electronics and Electrical Engineering (U.S.).
‡bElectron Devices Division.
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710 |
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‡aSolecon Laboratories.
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‡a006865785
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