Spreading resistance analysis for silicon layers with nonuniform resistivity /
David H. Dickey, Solecon Laboratories, and James R. Ehrstein, Electron Devices Division, Center for Electronics & Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

APA Citation

Dickey, D. H., Ehrstein, J. R., United States. Defense Advanced Research Projects Agency., Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division., Solecon Laboratories. (1979). Spreading resistance analysis for silicon layers with nonuniform resistivity. Washington: Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off..

MLA Citation

Solecon Laboratories, et al.. Spreading Resistance Analysis for Silicon Layers With Nonuniform Resistivity. Washington: Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.