An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices /
David L. Blackburn, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

Description

Main Author

Blackburn, David L.

Related Names

United States. Division of Electric Energy Systems.
Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.

Language(s)

English

Published

Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.

Subjects

Semiconductors > Semiconductors / Quality control > Semiconductors / Quality control / Data processing.
Photoconductivity.

Physical Description

iv, 35 p. : ill. ; 26 cm.

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