A manual wafer probe station for an integrated circuit test system

LDR 01749cam a2200421 a 4500
001 006865768
003 MiAaHDL
005 20221205000000.0
006 m d
007 cr bn ---auaua
008 811203s1981 dcua b f000 0 eng c
010 ‡a81600033
020 ‡c$2.00
029 1 ‡aAU@ ‡b000042691722
035 ‡a(MiU)990068657680106381
035 ‡asdr-miu.990068657680106381
035 ‡asdr-ucr991006981559704706
035 ‡asdr-uiuc497550
035 ‡z(MiU)MIU01000000000000006865768-goog
035 ‡a(OCoLC)7695149
035 ‡z(MiU)Aleph006865768
040 ‡aDGPO/DLC ‡cDLC ‡dOCLCQ ‡dBTCTA ‡dNSBSP
049 ‡aNSBA
086 0 ‡aC 13.10:400-68
100 1 ‡aCarver, G. P.
245 1 2 ‡aA manual wafer probe station for an integrated circuit test system / ‡cG.P. Carver and W.A. Cullins.
246 1 6 ‡aSemiconductor measurement technology.
260 ‡a[Washington, D.C.] : ‡bU.S. Dept. of Commerce, National Bureau of Standards : ‡bFor sale by the Supt. of Docs., U.S. G.P.O., ‡c1981.
300 ‡aiv, 14 p. : ‡bill. ; ‡c26 cm.
490 0 ‡aU.S. Department of Commerce National Bureau of Standards special publication ; ‡v400-68
500 ‡aItem 247.
500 ‡aS/N 003-003-02319-1.
500 ‡a"Issued May 1981."
500 ‡a"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aProbes (Electronic instruments)
650 0 ‡aIntegrated circuits ‡xTesting.
700 1 ‡aCullins, W. A.
710 1 ‡aUnited States. ‡bNational Bureau of Standards. ‡tSpecial publication.
710 2 ‡aCenter for Electronics and Electrical Engineering (U.S.). ‡bElectron Devices Division.
899 ‡a39015077586017
CID ‡a006865768
DAT 0 ‡b20221205000000.0
DAT 1 ‡a20221207140737.0 ‡b2024-02-25T18:44:50Z
CAT ‡aSDR-MIU ‡cmiu ‡dALMA ‡lprepare.pl-004-008
FMT ‡aBK
HOL ‡0sdr-miu.990068657680106381 ‡aMiU ‡bSDR ‡cGWLA ‡f006865768 ‡pmdp.39015077586017 ‡sMIU ‡1990068657680106381
974 ‡bMIU ‡cGWLA ‡d20240225 ‡sgoogle ‡umdp.39015077586017 ‡y1981 ‡rpd ‡qbib ‡tUS fed doc
974 ‡bUC ‡cUCR ‡d20231101 ‡sgoogle ‡uuc1.31210024949180 ‡y1981 ‡rpd ‡qbib ‡tUS fed doc
974 ‡bUIU ‡cUIUC ‡d20230313 ‡sgoogle ‡uuiug.30112075693678 ‡y1981 ‡rpd ‡qbib ‡tUS fed doc