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01749cam a2200421 a 4500 |
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20221205000000.0 |
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811203s1981 dcua b f000 0 eng c |
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‡a81600033
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‡c$2.00
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‡aNSBA
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⊔ |
‡aC 13.10:400-68
|
100 |
1 |
⊔ |
‡aCarver, G. P.
|
245 |
1 |
2 |
‡aA manual wafer probe station for an integrated circuit test system /
‡cG.P. Carver and W.A. Cullins.
|
246 |
1 |
6 |
‡aSemiconductor measurement technology.
|
260 |
⊔ |
⊔ |
‡a[Washington, D.C.] :
‡bU.S. Dept. of Commerce, National Bureau of Standards :
‡bFor sale by the Supt. of Docs., U.S. G.P.O.,
‡c1981.
|
300 |
⊔ |
⊔ |
‡aiv, 14 p. :
‡bill. ;
‡c26 cm.
|
490 |
0 |
⊔ |
‡aU.S. Department of Commerce National Bureau of Standards special publication ;
‡v400-68
|
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⊔ |
⊔ |
‡aItem 247.
|
500 |
⊔ |
⊔ |
‡aS/N 003-003-02319-1.
|
500 |
⊔ |
⊔ |
‡a"Issued May 1981."
|
500 |
⊔ |
⊔ |
‡a"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
|
504 |
⊔ |
⊔ |
‡aIncludes bibliographical references.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aProbes (Electronic instruments)
|
650 |
⊔ |
0 |
‡aIntegrated circuits
‡xTesting.
|
700 |
1 |
⊔ |
‡aCullins, W. A.
|
710 |
1 |
⊔ |
‡aUnited States.
‡bNational Bureau of Standards.
‡tSpecial publication.
|
710 |
2 |
⊔ |
‡aCenter for Electronics and Electrical Engineering (U.S.).
‡bElectron Devices Division.
|
899 |
⊔ |
⊔ |
‡a39015077586017
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‡a006865768
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