A manual wafer probe station for an integrated circuit test system /
G.P. Carver and W.A. Cullins.

APA Citation

Carver, G. P., Cullins, W. A., Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division. (1981). A manual wafer probe station for an integrated circuit test system. [Washington, D.C.]: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

Carver, G. P, W. A Cullins, and Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division. A Manual Wafer Probe Station for an Integrated Circuit Test System. [Washington, D.C.]: U.S. Dept. of Commerce, National Bureau of Standards , 1981.