Catalog Record: Measurement techniques for high power semiconductor materials and devices : annual report | HathiTrust Digital Library

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Measurement techniques for high power semiconductor materials and devices :
annual report /
U.S. Department of Commerce, National Bureau of Standards, National Engineering Laboratory, Center for Electronics and Electrical Engineering, Semiconductor Materials and Processes Division ; prepared for Department of Energy, Division of Electric Energy Systems.

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Language(s): English
Published: Washington, D.C. : The Division ;
Subjects: Semiconductors > Semiconductors / Measurements > Semiconductors / Measurements / Periodicals.
Note: Description based on: Oct. 1, 1980-Dec. 31, 1981.
Vols. for <1980-1981-> distributed to depository libraries in microfiche.
Vols. for <-1977> were prepared by Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratoy, National Bureau of Standards.
Physical Description: volumes : illustrations ; 28 cm.
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Full view1977 University of Minnesota