Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /
Martin G. Buehler.

Description

Main Author

Buehler, Martin G.

Language(s)

English

Published

Washington : U.S. Dept. of Commerce, National Bureau of Standards : 1976.

Subjects

Condensateurs électriques > Condensateurs électriques / Défauts.
Semiconducteurs > Semiconducteurs / Jonctions > Semiconducteurs / Jonctions / Défauts.
Electric measurements.
Cryostats.
Capacitors > Capacitors / Defects.
Semiconductors > Semiconductors / Junctions > Semiconductors / Junctions / Defects.

Physical Description

iii, 14 p. : ill. ; 26 cm.

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