Catalog Record: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script | HathiTrust Digital Library

Available Indexes

Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /
Martin G. Buehler.

Tools

Main Author: Buehler, Martin G.
Language(s): English
Published: Washington : U.S. Dept. of Commerce, National Bureau of Standards : 1976.
Subjects: Condensateurs électriques > Condensateurs électriques / Défauts.
Semiconducteurs > Semiconducteurs / Jonctions > Semiconducteurs / Jonctions / Défauts.
Electric measurements.
Cryostats.
Capacitors > Capacitors / Defects.
Semiconductors > Semiconductors / Junctions > Semiconductors / Junctions / Defects.
Physical Description: iii, 14 p. : ill. ; 26 cm.
Locate a Print Version: Find in a library

Viewability

Item Link Original Source
Full view Technical Report Archive & Image Library
Full view University of California
Full view Pennsylvania State University
Full view400-26 University of Illinois at Urbana-Champaign