Catalog Record: Microelectronic test pattern NBS-4 | HathiTrust Digital Library

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Microelectronic test pattern NBS-4 /
W. Robert Thurber and Martin G. Buehler.

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Main Author: Thurber, W. Robert.
Related Names: Buehler, Martin G.
Language(s): English
Published: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1978.
Subjects: Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Equipment and supplies.
Note: "This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards."
Physical Description: vi, 83 p. : ill. ; 26 cm.
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