Microelectronic test patterns: an overview /
[by] Martin G. Buehler.

Description

Main Author

Buehler, Martin G.

Related Names

United States. National Bureau of Standards.
United States. Defense Nuclear Agency.
United States. Defense Advanced Research Projects Agency.

Language(s)

English

Published

[Washington, D.C.] : National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.

Subjects

Electronic apparatus and appliances > Electronic apparatus and appliances / Testing.
Integrated circuits > Integrated circuits / Testing.

Note

"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."

Physical Description

19 p. : illus. ; 26 cm.

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