Microelectronic test patterns: an overview /
[by] Martin G. Buehler.
|Main Author:||Buehler, Martin G.|
[Washington, D.C.] : National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.
Electronic apparatus and appliances
Electronic apparatus and appliances /
Integrated circuits > Integrated circuits / Testing.
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."
19 p. :
|Locate a Print Version:||
Find in a library
|Item Link||Original Source|
|Full view||Technical Report Archive & Image Library|
|Full view400-6||University of Illinois at Urbana-Champaign|