Catalog Record: Microelectronic test patterns: an overview | HathiTrust Digital Library

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Microelectronic test patterns: an overview /
[by] Martin G. Buehler.


Main Author: Buehler, Martin G.
Language(s): English
Published: [Washington, D.C.] : National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.
Subjects: Electronic apparatus and appliances > Electronic apparatus and appliances / Testing.
Integrated circuits > Integrated circuits / Testing.
Note: "Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."
Physical Description: 19 p. : illus. ; 26 cm.
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