Conference proceedings /
ISTFA ... International Symposium for Testing and Failure Analysis.

Description

Previous Title

Proceedings.

Meeting Name

International Symposium for Testing and Failure Analysis.

Language(s)

English

Published

[Metals Park Ohio] : ASM International, [c1987. i.e. c1988-

Subjects

Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses.
Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses.
Materials > Materials / Testing > Materials / Testing / Congresses.
Electronics > Electronics / Materials > Electronics / Materials / Testing > Electronics / Materials / Testing / Congresses.

Note

Vols. for <2000-> accompanied by CD-ROMs.
"The failure analysis forum for microelectronics and advanced materials".

Physical Description

v. : ill. ; 28 cm.

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