Proceedings /
ISTFA, International Symposium for Testing and Failure Analysis.

Description

New Title

Conference proceedings.

Meeting Name

International Symposium for Testing and Failure Analysis.

Related Names

Advanced Materials Symposium.
Microelectronics Symposium.

Language(s)

English

Published

Lawndale, Calif. : ATFA, 1980-1987.

Subjects

Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses.
Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses.
Materials > Materials / Testing > Materials / Testing / Congresses.
Electronics > Electronics / Materials > Electronics / Materials / Testing > Electronics / Materials / Testing / Congresses.

Note

Imprint varies: Torrance, Calif., 1982-1985; Metals Park, Ohio : ASM International, 1986-
Issue for 1987 published in 2 vols. called: proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium.

Physical Description

8 v. : ill. ; 28 cm.

ISBN

0871703122 (1987)

Locate a Print Version

Find in a library

Viewability