ISTFA 2000 :
proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Description

Meeting Name: International Symposium for Testing and Failure Analysis Bellevue, Wash.) 2000 : (26th :
Related Names: Electronic Device Failure Analysis Society.
ASM International.
Language(s): English
Published: Materials Park, Ohio : ASM International, c2000.
Subjects: Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses.
Electronics > Electronics / Materials > Electronics / Materials / Testing > Electronics / Materials / Testing / Congresses.
Note: Sponsored by EDFAS, ISTFA.
Physical Description: xvi, 577 p. : ill. ; 28 cm + 1 computer laser optical disc (4 3/4 in.)
ISBN: 0871707012
Locate a Print Version: Find in a library

Item Link	Original Source
Limited (search only)	Cornell University