Conference proceedings

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111 2 ⊔ ‡aInternational Symposium for Testing and Failure Analysis.
245 1 0 ‡aConference proceedings / ‡cISTFA ... International Symposium for Testing and Failure Analysis.
246 1 8 ‡f1989- ‡aISTFA ... conference proceedings
246 1 8 ‡aISTFA
246 1 4 ‡aProceedings of the International Symposium on Testing and Failure Analysis
246 1 4 ‡f1994- ‡aProceedings of the ... Symposium for Testing and Failure Analysis
246 1 3 ‡aISTFA proceedings
260 ⊔ ⊔ ‡a[Metals Park Ohio] : ‡bASM International, ‡c[c1987. i.e. c1988-
300 ⊔ ⊔ ‡av. : ‡bill. ; ‡c28 cm.
362 0 ⊔ ‡a1988-
500 ⊔ ⊔ ‡aVols. for <2000-> accompanied by CD-ROMs.
500 ⊔ ⊔ ‡a"The failure analysis forum for microelectronics and advanced materials".
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aSemiconductors ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aElectronic apparatus and appliances ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aMaterials ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aElectronics ‡xMaterials ‡xTesting ‡vCongresses.
780 0 0 ‡aInternational Symposium for Testing and Failure Analysis / ‡tProceedings.
CID ⊔ ⊔ ‡a012275286
DAT 0 ⊔ ‡b20110810000000.0
DAT 1 ⊔ ‡a20130416093338.0 ‡b2024-02-05T18:32:43Z
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