Proceedings

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020 ⊔ ⊔ ‡a0871703122 (1987)
022 0 ⊔ ‡a0890-1740
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111 2 ⊔ ‡aInternational Symposium for Testing and Failure Analysis.
245 1 0 ‡aProceedings / ‡cISTFA, International Symposium for Testing and Failure Analysis.
246 1 8 ‡aISTFA
246 1 3 ‡aProceedings, ISTFA
246 1 0 ‡aProceedings of the Advanced Materials Symposium
246 1 0 ‡aProceedings of the Microelectronics Symposium
260 ⊔ ⊔ ‡aLawndale, Calif. : ‡bATFA, ‡c1980-1987.
300 ⊔ ⊔ ‡a8 v. : ‡bill. ; ‡c28 cm.
362 0 ⊔ ‡a1980 - 1987.
500 ⊔ ⊔ ‡aImprint varies: Torrance, Calif., 1982-1985; Metals Park, Ohio : ASM International, 1986-
500 ⊔ ⊔ ‡aIssue for 1987 published in 2 vols. called: proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aSemiconductors ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aElectronic apparatus and appliances ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aMaterials ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aElectronics ‡xMaterials ‡xTesting ‡vCongresses.
711 2 ⊔ ‡aAdvanced Materials Symposium.
711 2 ⊔ ‡aMicroelectronics Symposium.
785 0 0 ‡aInternational Symposium for Testing and Failure Analysis / ‡tConference proceedings.
CID ⊔ ⊔ ‡a012260990
DAT 0 ⊔ ‡b20110518000000.0
DAT 1 ⊔ ‡a20130416092322.0 ‡b2023-07-20T18:22:13Z
CAT ⊔ ⊔ ‡aSDR-PST ‡dUNKNOWN ‡lloader.pl-002-002
FMT ⊔ ⊔ ‡aSE
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