The destructive bond pull test /
John Albers, editor ; Electronic Technology Division.
Description
- Language(s)
-
English
- Published
-
[Washington] : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
- Note
-
CODEN: XNBSAV.
[$1.25, 13 cds]
"Jointly supported by the National Bureau of Standards, the Defense Nuclear Agency, and the Navy Strategic Systems Project Office."
- Physical Description
-
vi, 44, [1] p. :
ill. ;
26 cm.
Viewability
Item Link |
Original Source |
Full view
|
University of California
|
Full view
|
Technical Report Archive & Image Library
|
Full view 400-18
|
University of Illinois at Urbana-Champaign
|