The destructive bond pull test

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100 1 0 ‡aAlbers, John.
245 1 4 ‡aThe destructive bond pull test / ‡cJohn Albers, editor ; Electronic Technology Division.
260 0 ‡a[Washington] : ‡bU.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1976.
300 ‡avi, 44, [1] p. : ‡bill. ; ‡c26 cm.
490 0 ‡aSemiconductor measurement technology.
490 0 ‡aNBS special publication ; 400-18.
500 ‡aCODEN: XNBSAV.
500 ‡a[$1.25, 13 cds]
500 ‡a"Jointly supported by the National Bureau of Standards, the Defense Nuclear Agency, and the Navy Strategic Systems Project Office."
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aAluminum wire ‡xTesting.
710 1 0 ‡aUnited States. ‡bNavy Strategic Systems Projects Office.
710 1 0 ‡aUnited States. ‡bDefense Nuclear Agency.
710 2 0 ‡aInstitute for Applied Technology (U.S.). ‡bElectronic Technology Division.
CID ‡a006865971
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