Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes /
James M. Kenney ; Electronic Technology Division.
Description
- Language(s)
-
English
- Published
-
Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : 1976.
- Note
-
S/N 003-003-01635-7.
Item 247.
Activity supported in cooperation with the Defense Nuclear Agency.
CODEN: XNBSAV.
- Physical Description
-
[2], 26, [1] p. :
ill. ;
26 cm.
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