Methods of measurement for semicaonductor materials, process control, and devices :
quarterly report, January 1 to March 31, 1970 /
edited by W. Murray Bullis and A.J. Barody, Jr.
|Corporate Author:||Institute for Applied Technology (U.S.)|
|Related Names:||Baroody, A. J. , Bullis, W. Murray 1930-|
Washington, D.C. : U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970.
"Jointly supported by the National Bureau of Standards, the Defense Atomic Support Agency, the U.S. Navy Strategic Systems Project Office, the U.S. Navy Electronic Systems Command, and the National Aeronautics and Space Administration."
v, 58 p. :
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|Full view||University of Illinois at Urbana-Champaign|