Thermal stability of Wurtzite and Sphalerite structures /
Yoshizo Inomata.

Description

Main Author

Inomata, Yoshizō

Related Names

Air Force Cambridge Research Laboratories (U.S.)

Language(s)

English

Published

L.G. Hanscom Field, Bedford, Massachusetts : Air Force Cambridge Research Laboratories, Air Force Systems Command, United States Air Force, 1971.

Subjects

Silicon carbide.
Semiconductors.
Nitrides.
Crystals > Crystals / Structure.
Beryllium oxide.
Aluminum compounds.
Nitrides.
Aluminum compounds.
Beryllium oxide.
Semiconductors.
Crystals > Crystals / Structure.
Silicon carbide.

Summary

The thermal stability of the tetrahedral wurtzite and sphalerite structures is discussed using AlN, BeO, ZnS, and SiC structural and physical data. (Author).

Note

Translation supported by the Air Force Cambridge Research Laboratories, Air Force Systems Command, United States Air Force (L.G. Hanscom Field, Mass.), and translated by the Oriental Science Research Library of Emmanuel College, Boston, Massachusetts under Contract F19628-71-C-0121.
Translated from Ceramic Society of Japan Journal (Yogyo Kyokai-Shi). v. 78, n. 11, pp. 365-369, 1970.
AFCRL Research Laboratory.
AD0736407 (from http://www.dtic.mil).
"4 October 1971."

Physical Description

vi, 14 pages : illustrations ; 28 cm.

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