Proceedings of the ... IEEE International Conference on Microelectronic Test Structures.

Description

New Title

Proceedings of the ... International Conference on Microelectronic Test Structures.

Meeting Name

IEEE International Conference on Microelectronic Test Structures.

Related Names

IEEE Electron Devices Society.

Language(s)

English

Published

New York, N.Y. : Institute of Electrical and Electronics Engineers, 1986 [i.e., 1988].

Subjects

Microelectronics > Microelectronics / Congresses.
Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses.

Note

Sponsored by the IEEE Electron Devices Society.

Physical Description

1 v. : ill. ; 28 cm.

Locate a Print Version

Find in a library

Viewability