Proceedings of the ... IEEE International Conference on Microelectronic Test Structures.
APA Citation
IEEE International Conference on Microelectronic Test Structures., IEEE Electron Devices Society. (19861988). Proceedings of the ... IEEE International Conference on Microelectronic Test Structures. New York, N.Y.: Institute of Electrical and Electronics Engineers.
MLA Citation
IEEE International Conference on Microelectronic Test Structures, and IEEE Electron Devices Society. Proceedings of the ... IEEE International Conference On Microelectronic Test Structures. New York, N.Y.: Institute of Electrical and Electronics Engineers, 19861988.
Warning: These citations may not always be complete (especially for serials).