Proceedings of the ... IEEE International Conference on Microelectronic Test Structures ICMTS.

Description

New Title

Proceedings of the ... International Conference on Microelectronic Test Structures

Previous Title

IEEE VLSI Workshop on Test Structures

Meeting Name

IEEE International Conference on Microelectronic Test Structures.

Related Names

IEEE Electron Devices Society.

Language(s)

English

Published

Piscataway, N.J. : Institute of Electrical and Electronics Engineers, 1988.

Subjects

Integrated circuits > Integrated circuits / Design and construction > Integrated circuits / Design and construction / Congresses.
Microelectronics > Microelectronics / Congresses.

Note

Sponsored by the IEEE Electron Devices Society.

Physical Description

1 v. : ill ; 28 cm.

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