Methods of measurement for semiconductor materials, process control, and devices.
Quarterly report, July 1 to Sept. 30, 1968.
Ed. by W. Murray Bullis.

Description

Tools

Cite this Export citation file

Corporate Author: United States. National Bureau of Standards.
Related Names: Bullis, W. Murray, 1930-, ed.
Language(s): English
Published: Washington, D.C., Supt. of Docs., G.P.O., 1968.
Subjects: Semiconductors.
Physical Description: 42 p. illus.
Locate a Print Version: Find in a library

Viewability

Item Link	Original Source
Full view	University of Illinois at Urbana-Champaign

View HathiTrust MARC record