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Methods of measurement for semiconductor materials, process control, and devices.
Quarterly report, July 1 to Sept. 30, 1968.
Ed. by W. Murray Bullis.

APA Citation

United States. National Bureau of Standards., Bullis, W. Murray. (1968). Methods of measurement for semiconductor materials, process control, and devices: Quarterly report, July 1 to Sept. 30, 1968. Washington, D.C.: Supt. of Docs., G.P.O..

MLA Citation

United States. National Bureau of Standards, and W. Murray Bullis. Methods of Measurement for Semiconductor Materials, Process Control, And Devices: Quarterly Report, July 1 to Sept. 30, 1968. Washington, D.C.: Supt. of Docs., G.P.O., 1968.

Warning: These citations may not always be complete (especially for serials).