ATFA-77, advanced techniques in failure analysis :
proceedings [of a symposium] held 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA /
sponsored by The Institute of Electrical and Electronics Engineers, (IEEE) Los Angeles Council/Region 6, Los Angeles, The International Metallographic Society

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Related Names
International Metallographic Society
Institute of Electrical and Electronics Engineers. Los Angeles Council
Institute of Electrical and Electronics Engineers
Language(s)
English
Published
New York : Institute of Electrical and Electronics Engineers, c1977
Subjects
Semiconductors > Testing > Congresses
Semiconductors > Defects > Congresses
Physical Description
viii, 345 p. : ill. ; 29 cm
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