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| 001 | 009672274 | ||
| 003 | MiAaHDL | ||
| 005 | 20110406000000.0 | ||
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| 007 | cr bn ---auaua | ||
| 008 | 771108s1977 nyua b 100 0 eng d | ||
| 035 | ⊔ | ⊔ | ‡asdr-ucsd.b61967154 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)3400527 |
| 040 | ⊔ | ⊔ | ‡aIND ‡cIND ‡dOCL ‡dOCLCQ ‡dCUS ‡dUtOrBLW |
| 050 | ⊔ | 0 | ‡aTK7871.85 ‡b.A274 |
| 090 | ⊔ | ⊔ | ‡aTK7871.85 ‡b.A244 1977 |
| 245 | 0 | 0 | ‡aATFA-77, advanced techniques in failure analysis : ‡bproceedings [of a symposium] held 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA / ‡csponsored by The Institute of Electrical and Electronics Engineers, (IEEE) Los Angeles Council/Region 6, Los Angeles, The International Metallographic Society |
| 260 | ⊔ | ⊔ | ‡aNew York : ‡bInstitute of Electrical and Electronics Engineers, ‡cc1977 |
| 300 | ⊔ | ⊔ | ‡aviii, 345 p. : ‡bill. ; ‡c29 cm |
| 490 | 0 | ⊔ | ‡a77CH1248-4REG6 |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xTesting ‡vCongresses |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xDefects ‡vCongresses |
| 710 | 2 | ⊔ | ‡aInternational Metallographic Society |
| 710 | 2 | ⊔ | ‡aInstitute of Electrical and Electronics Engineers. ‡bLos Angeles Council |
| 710 | 2 | ⊔ | ‡aInstitute of Electrical and Electronics Engineers |
| 740 | 0 | ⊔ | ‡aAdvanced techniques in failure analysis |
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| DAT | 0 | ⊔ | ‡a20090204173059.0 ‡b20110406000000.0 |
| DAT | 1 | ⊔ | ‡a20120815102926.0 ‡b2023-06-10T17:52:11Z |
| CAT | ⊔ | ⊔ | ‡aSDR-UCSD ‡dIII - MILLENIUM ‡lloader.pl-001-001 |
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