ATFA-78 :
Advanced techniques in failure analysis, proceedings, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California, USA /
sponsored by the Institute of Electrical and Electronics Engineers, inc., IEEE Los Angeles Council, Region 6, Los Angeles

Description

Related Names

Institute of Electrical and Electronics Engineers. Los Angeles Council

Language(s)

English

Published

New York : IEEE, c1978

Subjects

Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses
Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses

Physical Description

vii, 200 p. : ill. ; 29 cm

Locate a Print Version

Find in a library

Viewability