Diagnostic techniques for semiconductor materials processing II ;
symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. /
editors, Stella W. Pang ... [et al.]

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Related Names
Pang, Stella W
Language(s)
English
Published
Pittsburgh, Pa. : Materials Research Society, 1996
Subjects
Semiconductors > Testing > Congresses
Physical Description
585 p. : ill. ; 24 cm
ISBN
1558993096 (alk. paper)
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