| LDR | 01072cam a22002658a 4500 | ||
| 001 | 009672218 | ||
| 003 | MiAaHDL | ||
| 005 | 20110406000000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 960207s1996 pau b 101 0 eng | ||
| 010 | ⊔ | ⊔ | ‡a96001592 |
| 020 | ⊔ | ⊔ | ‡a1558993096 (alk. paper) |
| 035 | ⊔ | ⊔ | ‡asdr-ucsd.b35122778 |
| 040 | ⊔ | ⊔ | ‡aDLC ‡cDLC |
| 050 | 0 | 0 | ‡aTK7871.85 ‡b.D496 1996 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)34191076 |
| 245 | 0 | 0 | ‡aDiagnostic techniques for semiconductor materials processing II ; ‡bsymposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. / ‡ceditors, Stella W. Pang ... [et al.] |
| 260 | ⊔ | ⊔ | ‡aPittsburgh, Pa. : ‡bMaterials Research Society, ‡c1996 |
| 300 | ⊔ | ⊔ | ‡a585 p. : ‡bill. ; ‡c24 cm |
| 490 | 0 | ⊔ | ‡aMaterials research Society symposium proceedings ; ‡vv. 406 |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xTesting ‡vCongresses |
| 700 | 1 | ⊔ | ‡aPang, Stella W |
| CID | ⊔ | ⊔ | ‡a009672218 |
| DAT | 0 | ⊔ | ‡b20110406000000.0 |
| DAT | 1 | ⊔ | ‡a20120815102926.0 ‡b2024-02-15T18:48:54Z |
| DAT | 2 | ⊔ | ‡a2024-02-15T18:30:02Z |
| CAT | ⊔ | ⊔ | ‡aSDR-UCSD ‡dIII - MILLENIUM ‡lloader.pl-001-001 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-ucsd.b35122778 ‡auc1 ‡bSDR ‡cUCSD ‡puc1.31822021371802 ‡sUC ‡1.b35122778 |
| 974 | ⊔ | ⊔ | ‡bUC ‡cUCSD ‡d20240215 ‡sgoogle ‡uuc1.31822021371802 ‡y1996 ‡ric ‡qbib ‡tUS bib date1 >= 1929 |