A method of determining the emission and susceptibility levels of electrically small objects using a TEM cell /
Ippalapalli Sreenivasiah, David C. Chang, Mark T. Ma.
Description
- Language(s)
-
English
- Published
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Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1981.
- Note
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"Issued April 1981."
"Electromagnetic Fields Division, National Engineering Laboratory, National Bureau of Standards."
"Electromagnetics Laboratory, Department of Electrical Engineering, University of Colorado."
- Physical Description
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v, 45 p. :
ill. ;
27 cm.
- ISBN
-
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