A method of determining the emission and susceptibility levels of electrically small objects using a TEM cell /
Ippalapalli Sreenivasiah, David C. Chang, Mark T. Ma.

APA Citation

Sreenivasiah, I., Ma, M. T., Chang, D. C., University of Colorado, B. Electromagnetics Laboratory., Center for Electronics and Electrical Engineering (U.S.). Electromagnetic Fields Division., United States. National Bureau of Standards. (1981). A method of determining the emission and susceptibility levels of electrically small objects using a TEM cell. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

United States. National Bureau of Standards, et al.. A Method of Determining the Emission And Susceptibility Levels of Electrically Small Objects Using a TEM Cell. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards , 1981.