A method of determining the emission and susceptibility levels of electrically small objects using a TEM cell

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100 1 ‡aSreenivasiah, Ippalapalli.
245 1 2 ‡aA method of determining the emission and susceptibility levels of electrically small objects using a TEM cell / ‡cIppalapalli Sreenivasiah, David C. Chang, Mark T. Ma.
260 ‡aWashington, D.C. : ‡bU.S. Dept. of Commerce, National Bureau of Standards : ‡bFor sale by the Supt. of Docs., U.S. G.P.O., ‡c1981.
300 ‡av, 45 p. : ‡bill. ; ‡c27 cm.
490 0 ‡aNBS technical note ; ‡v1040
500 ‡a"Issued April 1981."
500 ‡a"Electromagnetic Fields Division, National Engineering Laboratory, National Bureau of Standards."
500 ‡a"Electromagnetics Laboratory, Department of Electrical Engineering, University of Colorado."
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aElectric waves.
650 0 ‡aElectromagnetic fields.
650 0 ‡aMagnetic dipoles.
700 1 ‡aMa, Mark T.
700 1 ‡aChang, David C.
710 2 ‡aUniversity of Colorado, Boulder. ‡bElectromagnetics Laboratory.
710 2 ‡aCenter for Electronics and Electrical Engineering (U.S.). ‡bElectromagnetic Fields Division.
710 1 ‡aUnited States. ‡bNational Bureau of Standards.
CID ‡a009487947
DAT 0 ‡a20100930095820.0 ‡b20141009010000.0
DAT 1 ‡a20141112164151.0 ‡b2023-03-13T18:13:23Z
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