ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington

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111 2 ⊔ ‡aInternational Symposium for Testing and Failure Analysis ‡n(26th : ‡d2000 : ‡cBellevue, Wash.)
245 1 0 ‡aISTFA 2000 : ‡bproceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
246 3 0 ‡aConference Proceedings from the 26th International Symposium for Testing and Failure Analysis
246 3 0 ‡aProceedings of the 26th International Symposium or Testing and Failure Analysis
260 ⊔ ⊔ ‡aMaterials Park, Ohio : ‡bASM International, ‡cc2000.
300 ⊔ ⊔ ‡axvi, 577 p. : ‡bill. ; ‡c28 cm + ‡e1 computer laser optical disc (4 3/4 in.)
500 ⊔ ⊔ ‡aSponsored by EDFAS, ISTFA.
504 ⊔ ⊔ ‡aIncludes bibliographical references and index.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aElectronic apparatus and appliances ‡xTesting ‡vCongresses.
650 ⊔ 0 ‡aElectronics ‡xMaterials ‡xTesting ‡vCongresses.
710 2 ⊔ ‡aElectronic Device Failure Analysis Society.
710 2 ⊔ ‡aASM International.
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