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ISTFA 2000 :
proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

APA Citation

International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, W., Electronic Device Failure Analysis Society., ASM International. (2000). ISTFA 2000: proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, Ohio: ASM International.

MLA Citation

International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.), Electronic Device Failure Analysis Society, and ASM International. ISTFA 2000: Proceedings of the 26th International Symposium for Testing And Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, Ohio: ASM International, 2000.

Warning: These citations may not always be complete (especially for serials).

ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

APA Citation

MLA Citation

ISTFA 2000 :
proceedings of the 26th International Symposium for Testing and Failure Analysis : 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.