Proceedings of the ... IEEE International Conference on Microelectronic Test Structures ICMTS

LDR 01385nas a22002891a 4500
001 002470368
003 MiAaHDL
005 20210817000000.0
006 m d
007 cr bn ---auaua
008 910930d19881988njuar 1uuua0eng d
035 ⊔ ⊔ ‡a(MiU)990024703680106381
035 ⊔ ⊔ ‡asdr-miu.990024703680106381
035 ⊔ ⊔ ‡a(OCoLC)64221211
035 ⊔ ⊔ ‡a(RLIN)MIUG91-S2642
035 ⊔ ⊔ ‡z(MiU)Aleph002470368
040 ⊔ ⊔ ‡aPU ‡cPU ‡dMiU
111 2 ⊔ ‡aIEEE International Conference on Microelectronic Test Structures.
245 1 0 ‡aProceedings of the ... IEEE International Conference on Microelectronic Test Structures ICMTS.
246 1 3 ‡aIEEE proceedings on microelectronic test structures
246 1 0 ‡aICMTS
260 ⊔ ⊔ ‡aPiscataway, N.J. : ‡bInstitute of Electrical and Electronics Engineers, ‡c1988.
300 ⊔ ⊔ ‡a1 v. : ‡bill ; ‡c28 cm.
362 0 ⊔ ‡a1988.
538 ⊔ ⊔ ‡aMode of access: Internet.
550 ⊔ ⊔ ‡aSponsored by the IEEE Electron Devices Society.
580 ⊔ ⊔ ‡a"This meeting was formerly known as the VLSI Workshop on Test Structures which was held in 1984 and 1986."
650 ⊔ 0 ‡aIntegrated circuits ‡xDesign and construction ‡xCongresses.
650 ⊔ 0 ‡aMicroelectronics ‡vCongresses.
710 2 ⊔ ‡aIEEE Electron Devices Society.
780 0 0 ‡aIEEE VLSI Workshop on Test Structures. ‡tIEEE VLSI Workshop on Test Structures
785 0 0 ‡aIEEE International Conference on Microelectronic Test Structures. ‡tProceedings of the ... International Conference on Microelectronic Test Structures
CID ⊔ ⊔ ‡a002470368
DAT 0 ⊔ ‡a19950512000000.0 ‡b20210817000000.0
DAT 1 ⊔ ‡a20210911090737.0 ‡b2023-04-06T17:33:27Z
CAT ⊔ ⊔ ‡aSDR-MIU ‡dALMA ‡lprepare.pl-004-008
FMT ⊔ ⊔ ‡aSE
HOL ⊔ ⊔ ‡0sdr-miu.990024703680106381 ‡aMiU ‡bSDR ‡cMIU ‡pmdp.39015012686476 ‡sMIU ‡z88CH2560-1 1988 ‡1990024703680106381
974 ⊔ ⊔ ‡bMIU ‡cMIU ‡d20230406 ‡sgoogle ‡umdp.39015012686476 ‡z88CH2560-1 1988 ‡y1988 ‡ric ‡qbib ‡tUS serial item date >= 1929