Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida

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245 0 0 ‡aCharacterization of very high speed semiconductor devices and integrated circuits : ‡b23-25 March 1987, Bay Point, Florida / ‡cRavi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
260 ⊔ ⊔ ‡aBellingham, Wash., USA : ‡bSPIE--the International Society for Optical Engineering, ‡cc1987.
300 ⊔ ⊔ ‡ax, 359 p. : ‡bill. ; ‡c28 cm.
490 0 ⊔ ‡aSPIE ; ‡vv. 795
490 0 ⊔ ‡aCritical reviews of optical science and technology
504 ⊔ ⊔ ‡aIncludes bibliographies and index.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aSemiconductors ‡xTesting ‡xCongresses.
650 ⊔ 0 ‡aIntegrated circuits ‡xTesting ‡xCongresses.
650 ⊔ 0 ‡aVery high speed integrated circuits ‡xCongresses.
700 1 ⊔ ‡aJain, Ravi.
710 2 ⊔ ‡aMetallurgical Society (U.S.)
710 2 ⊔ ‡aSociety of Photo-optical Instrumentation Engineers.
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