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Characterization of very high speed semiconductor devices and integrated circuits :
23-25 March 1987, Bay Point, Florida /
Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

APA Citation

Jain, R., Metallurgical Society (U.S.)., Society of Photo-optical Instrumentation Engineers. (1987). Characterization of very high speed semiconductor devices and integrated circuits: 23-25 March 1987, Bay Point, Florida. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering.

MLA Citation

Jain, Ravi, Metallurgical Society (U.S.), and Society of Photo-optical Instrumentation Engineers. Characterization of Very High Speed Semiconductor Devices And Integrated Circuits: 23-25 March 1987, Bay Point, Florida. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.

Warning: These citations may not always be complete (especially for serials).

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida / Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

APA Citation

MLA Citation

Characterization of very high speed semiconductor devices and integrated circuits :
23-25 March 1987, Bay Point, Florida /
Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.