Effects of nuclear radiation on a high-reliability silicon power diode /
by Julian F. Been.

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Item Link Original Source
Limited (search only)   v.1 University of Illinois at Urbana-Champaign
Limited (search only)   v.2 University of Illinois at Urbana-Champaign
Limited (search only)   v.3 University of Illinois at Urbana-Champaign
Limited (search only)   v.4 University of Illinois at Urbana-Champaign