The measurement and analysis of pilot scanning and control behavior during simulated instrument approaches /
by David H. Weir and Richard H. Klein.

Description

Main Author

Weir, David H.

Related Names

Klein, Richard H.
United States. National Aeronautics and Space Administration.
Ames Research Center.
Systems Technology, inc.

Language(s)

English

Published

Washington, D.C. : National Aeronautics and Space Administration ; 1970.

Subjects

Instrument landing systems.
Simulation methods.
Air pilots.

Note

Prepared by Systems Technology, Inc., Hawthorne, Calif., for Ames Research Center under contract no. NAS 2-3746
"N70-29904."

Physical Description

1 v. (various pagings) : ill. ; 27 cm.

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