The measurement and analysis of pilot scanning and control behavior during simulated instrument approaches

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090 ‡aTL500 ‡b.T33 71-00102
100 1 ‡aWeir, David H.
245 1 4 ‡aThe measurement and analysis of pilot scanning and control behavior during simulated instrument approaches / ‡cby David H. Weir and Richard H. Klein.
246 3 ‡aNASA CR-1535
260 ‡aWashington, D.C. : ‡bNational Aeronautics and Space Administration ; ‡aSpringfield, VA : ‡bFor sale by the Clearinghouse for Federal Scientific and Technical Information, ‡c1970.
300 ‡a1 v. (various pagings) : ‡bill. ; ‡c27 cm.
490 0 ‡aNASA contractor report ; ‡v1535
500 ‡aPrepared by Systems Technology, Inc., Hawthorne, Calif., for Ames Research Center under contract no. NAS 2-3746
500 ‡a"N70-29904."
504 ‡aIncludes bibliographical references (p. 56-57).
538 ‡aMode of access: Internet.
650 0 ‡aInstrument landing systems.
650 0 ‡aSimulation methods.
650 0 ‡aAir pilots.
700 1 ‡aKlein, Richard H.
710 1 ‡aUnited States. ‡bNational Aeronautics and Space Administration.
710 2 ‡aAmes Research Center.
710 2 ‡aSystems Technology, inc.
CID ‡a011431058
DAT 0 ‡a20101026161643.0 ‡b20141013010000.0
DAT 1 ‡a20141112173021.0 ‡b2024-01-19T18:54:42Z
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