Proceedings, International Test Conference 1996

Description

Meeting Name

International Test Conference Washington, D.C.) 1996 : (27th :

Related Names

IEEE Computer Society
Institute of Electrical and Electronics Engineers

Language(s)

English

Published

Altoona, PA : The Conference ; c1996

Subjects

Neural networks (Computer science) > Neural networks (Computer science) / Congresses
Radio frequency > Radio frequency / Congresses
Fuzzy logic > Fuzzy logic / Congresses
Telecommunication > Telecommunication / Congresses
Electronic digital computers > Electronic digital computers / Circuits > Electronic digital computers / Circuits / Testing > Electronic digital computers / Circuits / Testing / Congresses
Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses

Physical Description

xii, 951 p. : ill. ; 28 cm

ISBN

0780335406 (softbound)
0780335414

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