Proceedings, International Test Conference 1996

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111 2 ‡aInternational Test Conference ‡n(27th : ‡d1996 : ‡cWashington, D.C.)
245 1 0 ‡aProceedings, International Test Conference 1996
246 1 4 ‡a1996 IEEE International Test Conference
246 3 0 ‡aInternational Test Conference 1996
260 ‡aAltoona, PA : ‡bThe Conference ; ‡aPiscataway N.J. : ‡bAdditional copies can be ordered from the IEEE Service Center, ‡cc1996
300 ‡axii, 951 p. : ‡bill. ; ‡c28 cm
538 ‡aMode of access: Internet.
650 0 ‡aNeural networks (Computer science) ‡vCongresses
650 0 ‡aRadio frequency ‡vCongresses
650 0 ‡aFuzzy logic ‡vCongresses
650 0 ‡aTelecommunication ‡vCongresses
650 0 ‡aElectronic digital computers ‡xCircuits ‡xTesting ‡vCongresses
650 0 ‡aIntegrated circuits ‡xTesting ‡vCongresses
710 2 ‡aIEEE Computer Society
710 2 ‡aInstitute of Electrical and Electronics Engineers
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