Proceedings, International Test Conference 1995

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Meeting Name: International Test Conference Washington, D.C.) 1995 : (26th :
Related Names: IEEE Computer Society
Institute of Electrical and Electronics Engineers
Language(s): English
Published: Altoona, PA : The Conference ; c1995
Subjects: Neural networks (Computer science) > Neural networks (Computer science) / Congresses
Radio frequency > Radio frequency / Congresses
Fuzzy logic > Fuzzy logic / Congresses
Telecommunication > Telecommunication / Congresses
Electronic digital computers > Electronic digital computers / Circuits > Electronic digital computers / Circuits / Testing > Electronic digital computers / Circuits / Testing / Congresses
Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses
Physical Description: xii 1011 p. : ill. ; 28 cm
ISBN: 0780329910 (softbound)
0780329929
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