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| 090 | ⊔ | ⊔ | ‡aTK7874 ‡b.I593 1995 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)36363854 |
| 111 | 2 | ⊔ | ‡aInternational Test Conference ‡n(26th : ‡d1995 : ‡cWashington, D.C.) |
| 245 | 1 | 0 | ‡aProceedings, International Test Conference 1995 |
| 246 | 1 | 4 | ‡a1995 IEEE International Test Conference |
| 246 | 1 | 0 | ‡aInternational Test Conference 1995 |
| 260 | ⊔ | ⊔ | ‡aAltoona, PA : ‡bThe Conference ; ‡aPiscataway N.J. : ‡bAdditional copies can be ordered from the IEEE Service Center, ‡cc1995 |
| 300 | ⊔ | ⊔ | ‡axii 1011 p. : ‡bill. ; ‡c28 cm |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
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| 650 | ⊔ | 0 | ‡aElectronic digital computers ‡xCircuits ‡xTesting ‡vCongresses |
| 650 | ⊔ | 0 | ‡aIntegrated circuits ‡xTesting ‡vCongresses |
| 710 | 2 | ⊔ | ‡aIEEE Computer Society |
| 710 | 2 | ⊔ | ‡aInstitute of Electrical and Electronics Engineers |
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